As a key national institute, Tyndall’s world-class research teams perform ground-breaking research with an ‘excellent impact from excellent research’ philosophy, focusing on the delivery of value from research to the Irish economy. See how Tyndall are using their J. A. Woollam Ellipsometer…
“At Tyndall National Institute, we utilise the J. A. Woollam M-2000UI Spectroscopic Ellipsometer for comprehensive thin-film analysis within our cleanroom laboratories. This system plays a vital role in both research and process development, enabling us to extract precise optical constants (n, k) and film thickness across a wide range of materials used in photonics, semiconductors, and nanotechnology.”
“The M-2000UI offers a broad spectral measurement range from 245 nm to 1690 nm, which is essential for evaluating material transparency from the deep UV to the near-infrared. This capability is particularly important for applications that demand high optical performance in the short-wavelength range, such as UV-transparent coatings and advanced dielectric layers.”
In our experience, the J. A. Woollam Ellipsometer is an exceptionally reliable and accurate system that fully supports our need for high-resolution, non-destructive optical metrology.”
The M-2000® line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterisation. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool.
The M-2000 delivers both speed and accuracy. Its patented RCE technology combines Rotating Compensator Ellipsometry with high-speed CCD detection to collect the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations. The M-2000 is the first ellipsometer to truly excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general purpose thin film characterisation. No other ellipsometer technology acquires a full spectrum faster.
Intrigued?
Learn more about the capabilities of the M2000 series of ellipsometers and the rest of their range. To discuss your application, please contact our Technical Director, Dr. Shayz Ikram by email below or call (01372) 378822.
